Recent Developments in Lorentz Microscopy
DOI:
https://doi.org/10.6911/WSRJ.202507_11(7).0005Keywords:
LTEM, VFET, MBIR, In situ sample holder, Spherical aberration correction, AI.Abstract
Lorentz transmission electron microscopy (LTEM) has gradually evolved into a quantitative technique for analyzing the magnetization state of samples. This review presents latest advances of imaging techniques, including using spherical aberration correction to enhance spatial resolution, the application of Fresnel-variant 4D LTEM to improve temporal resolution, and the development of novel in situ sample holders. Discussion on vector field electron tomography (VFET), which enables three-dimensional reconstruction of magnetization information is also included. In addition, it provides a brief overview of how these advancements have been applied in recent material studies.
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